Description
| Product model | PXIe-4145 |
| Manufacturer | National Instruments (NI) |
| Product category | PXIe Source Measure Unit (SMU) |
| Number of channels | 4 independent channels |
| SMU mode | Voltage source / current measure (SVCM), Current source / voltage measure (SCVM) |
| Voltage source range | ±20 V |
| Current source range | ±1 A (max), with high-resolution ranges down to ±100 nA |
| Power per channel | Up to 10 W |
| Voltage measurement resolution | 10 µV (6½ digits) |
| Current measurement resolution | 10 pA (at 100 nA range) |
| Voltage accuracy (25°C) | ±(0.03% of reading + offset) |
| Current accuracy (25°C) | ±(0.05% of reading + offset) |
| Measurement speed | Up to 10,000 readings per second (at 4½ digits) |
| Quadrants | All four quadrants (sourcing and sinking current) |
| Output impedance | < 0.1 Ω (voltage source mode) |
| Remote sensing (4-wire) | Yes (supports Kelvin connections for accurate voltage measurement) |
| Protection | Overvoltage, overcurrent, overtemperature, arc detection |
| Connector type | Front-panel triaxial connectors (4 channels) |
| Triggering | PXIe backplane triggers, TTL I/O, software triggers |
| Synchronization | PXIe chassis synchronization via star trigger and system reference clock |
| Compatible chassis | PXI Express chassis with PXIe-1 (e.g., PXIe-1071, PXIe-1073, PXIe-1085) |
| Power consumption | < 20 W (typical) |
| Operating temperature | 0°C to 55°C |
| Storage temperature | -20°C to 70°C |
| Certifications | CE, FCC, UL, CSA, IEC 61010-1 |
| Warranty | 1 year (standard, when purchased new) |
Product introduction
The NI PXIe-4145 is a high-performance, 4-channel Source Measure Unit (SMU) from National Instruments (NI), designed for precision source and measurement applications in semiconductor testing, materials research, and advanced sensor characterization. As part of NI’s Semiconductor Test System (STS) platform and PXIe instrumentation family, the PXIe-4145 delivers four independent SMU channels in a single 3U PXIe slot, each capable of sourcing voltage or current while simultaneously measuring voltage and current with high accuracy and resolution.
This module operates in all four quadrants, meaning it can source or sink current while applying positive or negative voltage, enabling complete I-V (current-voltage) curve tracing for devices such as diodes, transistors, LEDs, resistors, and novel materials.
Each channel provides a ±20 V voltage range and can source/sink up to ±1 A of current, with a maximum power of 10 W per channel. The high-resolution ranges (down to ±100 nA) allow for ultra-low current measurements, critical for leakage current testing and nanoscale device characterization.
The PXIe-4145 features 6½-digit voltage resolution (10 µV) and femtoampere-level current resolution (10 pA), ensuring exceptional measurement fidelity even at very low signal levels. It supports remote sensing (4-wire Kelvin connections) via triaxial connectors, eliminating the effects of lead resistance and contact voltage drops for accurate voltage delivery and measurement.
With a measurement speed of up to 10,000 readings per second, the PXIe-4145 is suitable for high-throughput automated test systems. It integrates seamlessly with NI-DCPower driver software and LabVIEW, enabling rapid development of I-V sweeps, pulsed measurements, and parametric tests.
NI PXIe-4145
Core advantages and technical highlights
A key advantage of the PXIe-4145 is its four high-precision SMU channels in a compact PXIe form factor, offering excellent channel density for multi-device or multi-pin testing without requiring large rack-and-stack instruments.
The 10 µV voltage resolution and 10 pA current resolution enable detection of minute changes in device behavior, essential for failure analysis, process monitoring, and R&D.
Its four-quadrant operation allows for bidirectional current flow, making it ideal for testing devices with complex I-V characteristics, such as bipolar junction transistors (BJTs) or memristors.
The integrated protection features (overvoltage, overcurrent, overtemperature, arc detection) safeguard both the device under test (DUT) and the instrument, reducing the risk of damage during testing.
The PXIe backplane synchronization enables precise triggering and timing coordination with other PXIe modules (e.g., switches, digitizers), allowing for complex test sequences and multi-instrument synchronization.
Designed for industrial reliability, the PXIe-4145 operates in harsh environments and meets international safety and EMC standards.
Typical application scenarios
The PXIe-4145 is widely used in semiconductor device characterization to generate I-V curves for diodes, MOSFETs, and HEMTs.
In materials science, it measures resistivity, conductivity, and switching behavior of graphene, perovskites, and other novel materials.
For sensor testing, it evaluates resistive, capacitive, and piezoelectric sensors under varying bias conditions.
It is also used in LED and optoelectronic device testing, battery material research, and university research labs for low-level electrical measurements.
In automated production test, the PXIe-4145 performs parametric tests such as threshold voltage, leakage current, and on-resistance with high repeatability.
Due to its integration with LabVIEW and NI-DCPower, it is a popular choice for custom test systems requiring high-precision sourcing and measurement.
Related model recommendations
- NI PXIe-4141: 10W SMU,16 channels, lower power per channel, higher density.
- NI PXIe-4147: 20W SMU,4 channels, higher power for demanding applications.
- NI PXIe-4135: 20W SMU,1 channel, ultra-high precision.
- NI PXIe-4140: 20W SMU,8 channels, high channel count.
- Keysight B2900A Series: Benchtop SMUs with similar performance.
- Keithley 2400 Series: Industry-standard SMUs for lab and production.
- NI PXIe-4192: High-power SMU for battery and power device testing.
- Advantest T6373: High-performance SMU for semiconductor ATE.
- Marvin Test GT220: PXI SMU for functional test.
- Yokogawa GS820: Dual-channel source measure unit.
NI PXIe-4145
Installation, commissioning and maintenance instructions
Install the PXIe-4145 in a PXI Express chassis (e.g., PXIe-1073) and secure it. Connect the device under test (DUT) using triaxial cables with Kelvin (4-wire) connections to ensure accurate voltage measurement.
In NI MAX (Measurement & Automation Explorer), detect the module and configure SMU settings: select source mode (voltage or current), set range, compliance limits, and measurement speed.
In LabVIEW, use NI-DCPower API to create I-V sweeps, pulsed measurements, or constant bias tests. Enable remote sensing and protection features as needed.
Ensure proper grounding and shielding. Use guarded cables for low-current measurements to minimize leakage. Avoid contamination on test fixtures.
Perform external calibration annually or as required to maintain accuracy. Clean triaxial connectors with electronic contact cleaner if necessary.
